SEMICON Korea 2019

Sessions Speakers Exhibitors Products Press Releases Floor Plan

Metrology and Inspection Forum (Room #402, COEX)

24 Jan 19

10:00 AM - 7:00 PM

Tracks: Technology

Speaker(s): Ofer Adan, Director of Patterning Control Technology, Applied Materials; Ryoung-han Kim, Group Manager, imec (invited); Hiroki Kawada, Senior Engineer, Hitachi High-Technologies; Ming Feng Li, Senior Marketing director in Surfscan-ADE division, KLA Corporation; Christopher Kang, Process Integration Engineer, Northrop Grumman Corporation; Yudong Hao, Director, Nanometrics; Michael Shifrin, Product Manager of Advanced Modeling Solutions, Nova Measuring Instruments; OhJang Kwon, SK hynix; Jun Lang, Director Product Management, ASML; Hyo-Chang Lee, Research Scientist, Korea Research Institute of Standards and Science; Paul MacDonald, Senior Director, KLA Corporation

[New Waves: Ready to Enjoy?] The new waves of industry 4.0 is coming and the role of metrology and inspection is getting more and more important to enable it. To enjoy these waves, we need to prepare the new technologies and sources accordingly in a timely manner. With excellent 10 presentations from technology experts, you can get better understanding on MI challenges and solutions we’re facing now and near future and build the strong network with industry leaders. Too see session agenda, Please Click here

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