SEMICON Korea 2018

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Products (5)

Thermal F1

Brand new single function platform of Thermal emission microscope. More...

EO Probing Unit

Tool to observe a transistor's status through the Si substrate using an incoherent light source. More...

EMMI-X camera

250x more sensitive emission camera than our existing infrared camera for low-voltage devices. More...

IR-OBIRCH function 07 amp

Brand new OBIRCH amplifier with ultra-high sensitivity. More...

iPHEMOS-DD

Inverted Photo Emission microscope for tester direct docking. More...