ChirpE - SEMICON Korea 2018: Products

Products (4)

View/Sort by Exhibitor Name

CREA Tester for Power Device

It is able to test a wafer level to packages and combined AC & DC parameters to Max. 10KV/10KA for the Power Devices. It is provided the IEC-standa... More...

Sintering-System for Power Device

Hakuto Co., Ltd. (Booth A126)

Sintering-System for Power Device(R&D and High volume sysytem) More...

Ion Beam Milling System

Hakuto Co., Ltd. (Booth A126)

The etching of Fe, Ni, Co, Pt, Alloyed materials is possible. More...

inTEST ThermalStream Solutions

Hakuto Co., Ltd. (Booth A126)

Rapid air temperature transitions of up to 18℃/sec More...