2018FLEX

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Semilab 

SE-2100 sheet to sheet spectroscopic ellipsometer

Semilab SE-2100 platform offers Optical & Electrical Metrology for Thin Film Coating characterization on flexible substrates (Sheet to Sheet). The ... More...

R2R Spectroscopic Ellipsometer

Semilab R2R SE platform offers multi-layer thickness and refractive index determination in real time, on a moving roll-to-roll foil. The platform a... More...