SEMICON Korea 2018

JEOL Korea Ltd. 

JSM-7900F Schottky Field Emission Scanning Electro

JSM-7900F is JEOL’s new flagship FE-SEM which combines extreme high resolution imaging, enhanced stability and exceptional ease of use for any leve... More...

[JEOL] IB-19520CCP Cross Section Polisher

Thermal damage can be reduced by cooling the specimen with liquid nitrogen during processing. Designed to suppress the consumption of liquid nitro... More...

[JEOL] JIB-4700F Multi Beam System

Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resol... More...

[JEOL] JBX-8100FS Electron Beam Lithography System

Spot type Electron Beam Lithography System JBX-8100FS achieved high throughput, small footprint and electric power saving. More...

[JEOL] JBX-9500FS Electron Beam Lithography System

JBX-9500FS is a 100kV EB system that provides world-top-level throughput and positional accuracy among Spot beam lithography systems. More...

[GenISys] Pro-SEM

ProSEM analyzes your SEM Image files, giving you fast, consistent feature measurements for your process calibration and monitoring tasks. More...