SEMICON Korea 2018
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Thermo Fisher Scientific Korea
 
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Meridian M
Static Optical Fault Isolation for Wafers and Packaged Parts
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Themis Z
Uncompromised atomic characterization across the widest range of materials Low damage, high sensitivity imaging and analysis of materials in 2D, 3...
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Metrios
The Metrios™ is a 200kV scanning/transmission electron microscope designed from the ground-up to deliver repeatable TEM and STEM-based imaging, ana...
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Helios G4 DualBeam
The Helios G4™ series is the world’s first 7nm capable DualBeam™ platform for imaging, analysis, and TEM sample preparation in semiconductor failur...
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Helios PFIB DualBeam System
Helios PFIB DualBeam™ provides unique capabilities to enable damage free delayering of sub-14nm semiconductor devices, advanced failure analysis of...
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