Practical Application of the IEEE P370 standard for measurement of interconnects up to 50 GHz
(Room Ballroom H)
17 Oct 18
3:05 PM
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3:35 PM
The IEEE P370 standard committee was tasked with writing guidelines for the design of test fixtures for measurement of interconnects up to 50 GHz, defining techniques for fixture de-embedding, and developing techniques and tools for validating the measured or calculated S-parameter data. That standard is described in “IEEE P370: A fixture design and data quality metric standard for interconnects up to 50 GHz,” also submitted for this conference. This paper discusses the practical aspects of these guidelines, reviews the “Plug and Play” validation kit hardware and S-parameter library files, and illustrates the use of some of the de-embedding techniques described in the standard. It also discusses the S-parameter quality metrics and the tools used for verifying S-parameter integrity, and illustrates their use by way of examples. The P370 committee is comprised of approximately 60 members from 25 companies including major test equipment manufacturers, and universities. The committee is making good progress, and the draft spec. is currently in review. The target date for the spec. to be ready for ballot vote is early 2019.