EDI CON USA 2018
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Jay
Diepenbrock
Jay Diepenbrock
SIRF Consultants, LLC
Joseph C. (Jay) Diepenbrock holds an Sc. B. from Brown University and an MSEE from Syracuse University. He had a long career at IBM working in many different areas including analog and digital IC and circuit design, high speed backplane design, RF design, and test and characterization of devices, connectors, and high speed cables. He was involved in the development of a number of standards including InfiniBand, PCI-express, USB, and the EIA-364 electronic test methods. He built, operated, and trained the staff of a high speed test lab. After leaving IBM, he was a Senior Vice President for High Speed at Lorom America, where he designed, built, and programmed an automated high speed cable test system. He is now an independent Signal Integrity and RF consultant with SIRF Consultants, LLC. His interests include photography, woodworking, amateur radio (an Extra Class licensee), and disaster relief with the IEEE and American Red Cross.
Sessions :
Practical Application of the IEEE P370 standard for measurement of interconnects up to 50 GHz
IEEE P370: A fixture design and data quality metric standard for interconnects up to 50 GHz
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