SEMICON Korea 2018
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JSM-7900F Schottky Field Emission Scanning Electro
JEOL Korea Ltd.
(
Booth
C416
)
JSM-7900F is JEOL’s new flagship FE-SEM which combines extreme high resolution imaging, enhanced stability and exceptional ease of use for any leve...
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[JEOL] IB-19520CCP Cross Section Polisher
JEOL Korea Ltd.
(
Booth
C416
)
Thermal damage can be reduced by cooling the specimen with liquid nitrogen during processing. Designed to suppress the consumption of liquid nitro...
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[JEOL] JIB-4700F Multi Beam System
JEOL Korea Ltd.
(
Booth
C416
)
Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resol...
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[JEOL] JBX-8100FS Electron Beam Lithography System
JEOL Korea Ltd.
(
Booth
C416
)
Spot type Electron Beam Lithography System JBX-8100FS achieved high throughput, small footprint and electric power saving.
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[JEOL] JBX-9500FS Electron Beam Lithography System
JEOL Korea Ltd.
(
Booth
C416
)
JBX-9500FS is a 100kV EB system that provides world-top-level throughput and positional accuracy among Spot beam lithography systems.
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[GenISys] Pro-SEM
JEOL Korea Ltd.
(
Booth
C416
)
ProSEM analyzes your SEM Image files, giving you fast, consistent feature measurements for your process calibration and monitoring tasks.
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