With accumulated know-how and technology over last 15 years, Seron provides full range of scanning electron microscope models from desktop mini SEM to FE SEM. Seron has been specialized in electron beam technology and provides not only SEM but also various advanced equipment such as e-beam joining system and hybrid XEM. Seron is proud that their product fully satisfies customer's various requ ests with their powerful instrument at competitive price range.
Since launched the very first Korean scanning electron microscope (SEM) in 2001, Seron Technologies Inc. has become one of valuable SEM brands.With accumulated know-how and technologies over past 15 years, Seron provides full range of SEM models from desktop SEM, compact SEM up to normal SEM.At the same time, Seron also has devoted to the various requests for advanced R&D researches by their unique e-beam technologies.Hybrid X-ray imaging SEM (Hybrid XEM) and micro e-beam joining system are their remarkable outcomes fot the edge of tomorrow. It is pleasure to announce that SEMICON/LED Korea 2016 will be the opening event of introducing the very first Korean FE SEM.
Product Categories
203 Equipment, Inspection & Measurement
- Defect; Particle; Bump; Contamination Detection, Review or Inspection
- Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr
- Plate Inspection Equipment
206 PV Equipment
- Inspection and Metrology
- Wafers
902 Other
- Other
903 LED
- FPD Inspection Equipment, Materials and Parts