Solve challenging yield issues with FEI solutions for extreme high resolution imaging and analysis. FEI helps you get your designs right, get to market first, and up to full production fast. Keep pace with shrinking nodes using our defect analysis, materials characterization, metrology and device edit solutions. Inspect for and analyze defects/failures with multiple image views: top down, cross-sectional (subsurface), and 3D volume. Collect compositional data to identify particles or track excursion origins. Study materials for next generation devices. Edit prototype devices. Visit us to learn how FEI will help you reduce costs and increase profitability.
Product Categories
- Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr