NEXTIN, a technology leading company in the field of inspection and metrology of semiconductor industry, provides AEGIS wafer inspection system and TWIN edge-trimming inspection integration module and developed Cube Scan for sub-10nm critical dimension metrology and High-Aspect-Ratio process inspection. We will keep providing the best solutions of defect inspection and metrology to our customers.
Product Categories
- Defect; Particle; Bump; Contamination Detection, Review or Inspection