Semilab is one of the leading metrology equipment supplier for material development and process control in the semiconductor, display, photovoltaic and flexible electronic industries. Our company offers advanced electrical and optical measurement systems, predominantly non-contact / non-destructive, for both R&D and production monitoring.
Our portfolio includes Spectroscopic Ellipsometry (SE), Non contact Sheet resistance, AFM, DLTS, Ellipsometric Porosimetry (EP), Photoluminescence, Raman, MBIR, SPV, µ-PCD and CV/IV measurements. We also propose 4PP and Nanoindentation. Major application areas of expertise include thin film thicknesses, optical properties, contamination monitoring, Metal oxides, dielectrics, III-V materials…
Recent areas of development allowed the combination of several metrology in one platform. For Example, Ellipsometry and non-contact sheet resistance can be applied together to TCO applications.
All technologies can be offered from tabletop or stand alone to fully automated platforms and, for some of them like Ellipsometry and Non contact sheet resistance, in-situ or in-line for Roll to Roll applications.
Product Categories
- Materials
- Tools & Equipment