We design, produce and sell metrology equipment for the characterization of semiconductor, Flat Panel and photovoltaic materials, for monitoring the manufacturing process of semiconductor devices and solar cells, and also for R&D purposes in these areas.
We offer a variety of measurement techniques; most of them are non-contact and non-destructive. Many of our technologies can be flexibly integrated in different platforms, ranging from simple handheld devices and table-top systems with high resolution mapping capability to fully automated stand-alone production control tools for mid-range and high-level fablines.
We also offer in-line measurements for solar cell production lines. Our strategy is to continuously improve our products, and to offer flexible solutions for our customers’ needs with high-value products for a reasonable price.
Product Categories
101 Photovoltaic Device Manufacturing
- PV: Cells
- PV: Stand-Alone Systems
203 Equipment, Inspection & Measurement
- Acoustic Spectroscopy; Electron Spectroscopy for Chemical Analysis (ESCA); Ultrasonic; Acoustical Mi
- CV (capacitance-to-voltage) Probe systems
- Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
- Line Width; Critical Dimension (CD) Measurement
- Microscopes: Atomic Force Microscopes (AFM)
- Plate Inspection Equipment
- Resistivity Measurement; 4 point probe; Sheet resistance
- Spectrometers; Fourier Transform Infrared (FTIR); Attenuated Total Reflectance FTIR (ATR-FTIR); Auge
- Stress; Refractive Index; Reflectivity & Conductivity Measurement
- Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
206 PV Equipment
- Inspection and Metrology
208 Equipment, Test
- Discrete Component Test Systems
- Probing Equipment incl. Analytical; Circuit; Manual; E-Beam; Optical; Wafer Probers
903 LED
- FPD Inspection Equipment, Materials and Parts
- OLED Related Equipment and Materials, Panel and Module