Camtek Limited product line delivers 100% surface, probe mark and bump inspection of finished wafers in their pre-sort, post-sort or post-dicing stages. Integrating 2D and 3D inspection, measurement and metrology capabilities, Camtek' Eagle and Condor model are focused on advanced packaging and delivers the versatility and efficiency to address all visual yield assurance needs in one compact platform. Intelligent auto-learning and extensive off-line review and recipe setup options enhance the system’s productivity. Camtek Limited is a global supplier of intelligent optical inspection systems to the semiconductor manufacturing and packaging industries, high density interconnect and PC board industries.
Product Categories
- Defect; Particle; Bump; Contamination Detection, Review or Inspection
- Die Inspection; Die Shear
- Line Width; Critical Dimension (CD) Measurement
- Microscopes: Confocal Scanning Microscope; 3-D Video Microscopes
- Microscopes: Optical Microscopes
- Thermal Sensing, Measurement, Analysis
- Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation