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Product Categories
203 Equipment, Inspection & Measurement
- Defect; Particle; Bump; Contamination Detection, Review or Inspection
208 Equipment, Test
- Logic Test Systems
- Memory Test Systems
- Probe Card Maintenance and Analysis Systems
308 Materials, Substrate
- Test; Monitor Wafers; Reclaim or Virgin
309 Materials, Test
- Probe Cards; DUT boards and other probing accessories (incl Ceramic and Special Purpose Probe Cards)
- Test Sockets; Contactors and Contact accessories