DAEIL SYSTEMS has been a leading manufacturer of vibration isolation systems in Korea since 1989, we mainly manufacture optical tables and vibration isolation in various platforms: lab table platform, tabletop platform, floor platform, sub-floor platform, passive vibration isolators for OEM and active vibration isolation systems. Most importantly, DAEIL has become the leading exemplar of delivering highest quality of active vibration isolation systems that our active systems offer optimal solutions for ultra-low frequency vibrations. 
 
 
                        
                            Product Categories
                        
                        
                                
                                    203 Equipment, Inspection & Measurement
                                    
                                
                                
                                        - Acoustic Spectroscopy; Electron Spectroscopy for Chemical Analysis (ESCA); Ultrasonic; Acoustical Mi
                                        
                                    
                                        - Chromatograph
                                        
                                    
                                        - CV (capacitance-to-voltage) Probe systems
                                        
                                    
                                        - Defect; Particle; Bump; Contamination Detection, Review or Inspection
                                        
                                    
                                        - Fiber Optic Inspection Instruments
                                        
                                    
                                        - Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
                                        
                                    
                                        - Flat; Notch Finding System
                                        
                                    
                                        - Line Width; Critical Dimension (CD) Measurement
                                        
                                    
                                        - Microscopes:  Atomic Force Microscopes (AFM)
                                        
                                    
                                        - Microscopes:  Confocal Scanning Microscope; 3-D Video Microscopes
                                        
                                    
                                        - Microscopes:  Optical Microscopes
                                        
                                    
                                        - Microscopes:  Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr
                                        
                                    
                                        - Overlay Measurement
                                        
                                    
                                        - Package Inspection; Lead Scanners
                                        
                                    
                                        - Particle Monitors; Analyzers - Airborne or Liquid
                                        
                                    
                                        - Plate Inspection Equipment
                                        
                                    
                                        - Resistivity Measurement; 4 point probe; Sheet resistance
                                        
                                    
                                        - Spectrometers; Fourier Transform Infrared (FTIR); Attenuated Total Reflectance FTIR (ATR-FTIR); Auge
                                        
                                    
                                        - Stress; Refractive Index; Reflectivity & Conductivity Measurement
                                        
                                    
                                        - Thermal Sensing, Measurement, Analysis
                                        
                                    
                                        - Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
                                        
                                    
                                        - Weight measurement; precision scales 
                                        
                                    
                                        - Wire Bonding Inspection; Test
                                        
                                    
                                        - X-ray; XRF; 3-D X-Ray; LEXES Systems
                                        
                                    
                                
                            
                                
                                    205 Equipment, Nanotechnology
                                    
                                
                                
                                        - Equipment, Nanotechnology Tools
                                        
                                    
                                
                            
                                
                                    206 PV Equipment
                                    
                                
                                
                                        - Cells
                                        
                                    
                                        - Inspection and Metrology
                                        
                                    
                                        - Integration and Automation
                                        
                                    
                                        - Modules
                                        
                                    
                                        - Thin Film
                                        
                                    
                                        - Wafers
                                        
                                    
                                
                            
                                
                                    207 Equipment, Process
                                    
                                
                                
                                        - Cleaning; Washing; Drying Equipment for Substrate, Fab Processing
                                        
                                    
                                        - Environmental Enclosures; Minienvironments
                                        
                                    
                                        - Lithography; Exposure; Aligners; Direct Write Systems; Steppers; Scanners; Nanoimprint
                                        
                                    
                                        - Transfer Systems for Wafer; Reticles or FPD's
                                        
                                    
                                        - Wafer Identification; Marking Equipment
                                        
                                    
                                
                            
                                
                                    304 Materials, Mask Making
                                    
                                
                                
                                        - Mask and Reticle Handling Products
                                        
                                    
                                        - Mask plate blanks; Glass
                                        
                                    
                                        - Pellicles; Mounting Fixtures
                                        
                                    
                                        - Plate or Pellicle Repair & Materials
                                        
                                    
                                        - Transfer lithography masks; Polymer masks; templates (for Nanoimprint)
                                        
                                    
                                
                            
                                
                                    305 Materials, Nanotechnology
                                    
                                
                                
                                        - Materials, Nanotechnology
                                        
                                    
                                
                            
                                
                                    306 PV Materials
                                    
                                
                                
                                        - Gases and Liquid Chemicals
                                        
                                    
                                
                            
                                
                                    401 Sub-systems
                                    
                                
                                
                                        - Pneumatic Systems; Pneumatic rotary spindles
                                        
                                    
                                
                            
                                
                                    902 Other
                                    
                                
                                
                                        - Other