INSPECTROLOGY is a metrology company which help semicondutor, compound semi, LED and MEMs producers to track their lithography every producing day with a nigh level TPUT, lowest COO of the metrology market and responsive Engineer.
INSPECTROLOGY sells new and remanufactured system to measure CD, Overlay and layer thicknesses
INSPECTROLOGY recently released the INSPEC Wafer which helps manufactured to certify their CD measurement for the ISO certification.
Product Categories
203 Inspection & Measurement Products
- Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
- Line Width; Critical Dimension (CD) Measurement
- Microscopes: Optical Microscopes
- Overlay Measurement
205 Nanotechnology Equipment and Tools
- Equipment, Nanotechnology Tools
206 PV Equipment
- Inspection and Metrology
700 Manufacturing Services
- Calibration & Reference Standards
- Lithography; Patterning service
- Measurement; Inspection Service