Product Categories
203 Inspection & Measurement Products
- Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
- Leak Detection Systems - Vacuum or Gas
- Microscopes: Optical Microscopes
- Microscopes: SEM; Focused Ion Beam (FIB), TEM
- Stress; Refractive Index; Reflectivity & Conductivity Measurement
- Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
207 Process Equipment
- Chemical Mechanical Polishing (CMP); Electro Polishing, Mechanical Polishing Equipment
- Etching; Stripping; Ashing - Dry and Wet Equipment
208 Test Equipment
- Probe Card Maintenance and Analysis Systems
401 Sub-systems
- Power Supplies; RF Generators; Converters; Electrical Conditioning
- Pumps, Vacuum
700 Manufacturing Services
- Measurement; Inspection Service