The J.A. Woollam Company offers a wide range of spectroscopic ellipsometers for nondestructive materials characterization, including thin film thickness (single and multilayer), optical constants, composition, growth/etch rates, and more. Instruments available for research and manufacturing metrology covering spectral ranges from vacuum ultra-violet to far infrared. Offering table-top, in-line, and in-situ models.
Product Categories
Analytical/Testing
- Analytical instrumentation
- Coating characterization, elemental analysis,surface analysis
Coatings/treatments for specific applications/properties
- Optical interference
- Photovoltaics
- Semiconductor
- Transparent conductive oxides
Consulting
- Testing/calibration
Process Monitoring and Control
- Deposition rate monitors/controllers
Substrate Materials
- Characterization
Testing/metrology
- Thickness