TheJ.A.WoollamCompanyoffersawiderangeofspectroscopicellipsometersfornondestructivematerialscharacterization,includingthinfilmthickness(singleandmultilayer),opticalconstants,composition,growth/etchrates,andmore.Instrumentsavailableforresearchandmanufacturingmetrologycoveringspectralrangesfromvacuumultra-violettofarinfrared.Offeringtable-top,in-line,andin-situmodels.
Product Categories
Analytical/Testing
- Analytical instrumentation
- Coating characterization, elemental analysis,surface analysis
Coatings/treatments for specific applications/properties
- Optical interference
- Photovoltaics
- Semiconductor
- Transparent conductive oxides
Consulting
- Testing/calibration
Process Monitoring and Control
- Deposition rate monitors/controllers
Substrate Materials
- Characterization
Testing/metrology
- Thickness