Horiba Scientific is the world-leading manufacturer of spectroscopic instrumentation. Our products include high performance Spectroscopic Ellipsometers (for ex-situ, in-situ or in-line applications,) end point detectors, Raman microscopes, EDXRF spectrometers, steady-state and lifetime spectrofluorometers, atomic emission spectroscopy, optical components and high performance CCDs.
Our new, fully automated UVISEL 2 spectroscopic ellipsometer offers 8 computer selectable spot sizes down to 35ìm, the smallest achromatic spot size available! Patented collinear imaging system gives clear visualization on practically any surface. In addition, Phase Modulation technology and advanced optical design provide unparalleled accuracy and high resolution ellipsometric measurements for characterizing ultra thin, as well as thick, films.
The GD-Profiler 2™ provides fast, simultaneous analysis of all elements, including nitrogen, oxygen, hydrogen and chlorine gasses, making an ideal tool for thin film characterization and process studies. Equipped with an RF source that can operate in pulse mode for fragile samples, the GD-Profiler 2™ can be used for corrosion studies and PVD coating process control, and in routine metal and alloys production plants.
Horiba Scientific's products offer unsurpassed precision and performance for applications in nanotechnology, semiconductors, pharmaceuticals, chemistry, photovoltaics, environmental and life sciences. HORIBA Scientific offers researchers the highest quality products and solutions, supported by a global network of scientists, engineers, technicians and customer service professionals.
HORIBA Scientific Products for all your Molecular, Elemental, Micro-Analysis, and Thin Film applications.
Product Categories
Analytical/Testing
- Analytical instrumentation
- Coating characterization, elemental analysis,surface analysis
Coatings/treatments for specific markets
- Aerospace
- Biotechnology
- Clean energy
- Display technology
- Semiconductor devices/cells
- Solar, photovoltaics
- Strip coating, metal
Testing/metrology
- Thickness