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At the SVC TechCon, m-u-t GmbH will demonstrate its omtsYs series 'lab-to-line’ thin film analysis (TFA) device for optically determining:
- Reflection and transmission characteristics
- Film thickness
- Moisture content
- Color
- Sheet resistance
Designed for both tabletop and inline-QA applications, the TFA can be used in harsh environments (e.g. inside vacuum coaters) and has been successfully incorporated in factories worldwide for thin film analysis. Full industrial software integration, supporting SECS-GEM, TCP-IP and Profibus protocols, is available. The widely installed TFA has been incorporated in the glass, paper, semiconductor, roll-to-roll coating, and photovoltaic industries.
For all our customers, we offer the following services:
- Free preliminary sample examination
- Expert optical analysis of transmission / reflection spectra
- Complete HW and SW integration of our measurement solutions for factory automation
To set up an appointment at the SVC Technology Exhibit, please contact us at:
EMAIL: info@mut-group.com
Product Categories
Analytical/Testing
- Analytical instrumentation
- Coating characterization, electrical properties
- Coating characterization, physical properties
Consulting
- Testing/calibration
Substrate Materials
- Characterization
Testing/metrology
- Electrical conduction
- Reflection
- Thickness