SEMICON Korea 2018
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HAMAMATSU PHOTONICS K.K.
 
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Thermal F1
Brand new single function platform of Thermal emission microscope.
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EO Probing Unit
Tool to observe a transistor's status through the Si substrate using an incoherent light source.
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EMMI-X camera
250x more sensitive emission camera than our existing infrared camera for low-voltage devices.
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IR-OBIRCH function 07 amp
Brand new OBIRCH amplifier with ultra-high sensitivity.
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iPHEMOS-DD
Inverted Photo Emission microscope for tester direct docking.
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