SEMICON Korea 2018
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Hakuto Co., Ltd.
 
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CREA Tester for Power Device
It is able to test a wafer level to packages and combined AC & DC parameters to Max. 10KV/10KA for the Power Devices. It is provided the IEC-standa...
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Sintering-System for Power Device
Sintering-System for Power Device(R&D and High volume sysytem)
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Ion Beam Milling System
The etching of Fe, Ni, Co, Pt, Alloyed materials is possible.
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inTEST ThermalStream Solutions
Rapid air temperature transitions of up to 18℃/sec
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