SEMICON Europa 2016

Johann Foucher
CEO
POLLEN Metrology


After receiving his PhD in 2003 from Grenoble University with a specialization in plasma physics and his usage for advanced semiconductor CMOS gate etching, Johann Foucher worked until 2012 for CEA/LETI institute as a researcher and project manager in the field of nanometrology for semiconductor industry. He has contributed to major AFM3D and CD-SEM enhancements for IC Manufacturing. From 2008 to 2012, he was assignee at IBM Fishkill where he has jointly developed new metrology methodologies for sub-30nm node technologies. It leads to the introduction of the hybrid metrology concept for the industry in order to get the best from each metrology technique to reduce R&D cycle time and increase yield ramp. In 2014, he has co-founded and is currently the CEO of the start-up POLLEN METROLOGY which develops and commercializes software solutions dedicated to hybrid metrology based on data fusion methodology. Such platform can be applied to any type of industry which produce or integrate nanomaterials in order to reduce drastically cycle time and produce sustainable nanotechnologies

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