SEMICON West 2016

Dale Ohmart
Test Engineering
Texas Instruments


Dale Ohmart is currently a Distinguished Member of the Technical Staff at Texas Instruments, where he is focused on driving test manufacturing excellence throughout the company. He joined Texas Instruments after graduating from the University of Kansas in 1980 with his Bachelors of Science degree in Engineering Physics. He was awarded “Outstanding Senior in Physics and Astronomy” that same year and remains a proud “Kansas Jayhawk”. Throughout his career, Dale has contributed at Texas Instruments in a variety of positions from his first role as Product Engineer onwards. He was quickly promoted to Test Engineering Manager for the Microprocessors group in 1981 and has been involved in test within the organization ever since. Dale has had many significant accomplishments during his tenure at Texas Instruments. He was instrumental in developing TI's current approach to managing test equipment productivity, he invented and holds the patent on TI's final test manufacturing process to ensure test quality, and he was the first to implement multisite testing on TI's high-pin-count digital signal processing (DSP) and micro-controller unit (MCU) products. He holds patents in both test and assembly manufacturing process and has a pending patent related to ATE design for efficient multisite test.

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