SEMICON West 2016

Brandon Mair
Probe Test Engineer
Texas Instruments


Brandon Mair is a native of Atlanta and graduated from Morehouse College and GA Tech with dual degree engineering BS in Applied Physics and Mechanical Engineering. He has been working in the Probe and Parametric Team of TTPEG within Texas Instruments full time since 2010. He runs a group called Design for Probe which main focus is to ensure the various TI sites across the globe have probe card technology aligned with TI's business units requirements.

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