Increasing Broadband Interconnect Characterization up to 60GHz
(Room 209)
18 Oct 18
2:25 PM
-
3:05 PM
VNA measurements are the backbone of any SI analysis, both for correlation and basic interconnect understanding. As bit rate increases and specs tighten, accurate measurement at higher frequencies is of paramount importance. For convenience, a coaxial style connector is often used to interface the DUT. This introduces discontinuities along the signal path that can severely affect the maximum measurement bandwidth. In this work we study the interface discontinuities that limit bandwidth from the connector to the PCB launch. We propose a PCB launch design pattern that enables measurement up to 60GHz and we show with the help of measurements, CT-SCANs, and simulations how PCB manufacturing variations can dramatically affect the effective measurement bandwidth.