EDI CON USA 2018

Eutectic Die Attach of GaN and MMiC Chips (Room 209)

17 Oct 18
2:25 PM - 3:05 PM
The latest GaN and GaAs circuit chips (die) are providing higher power levels than previous solid-state technologies. These new-generation devices require incredible precision and consistency throughout the die-attach and assembly process to ensure that the thermal flux from these devices is efficiently conducted to the heat spreaders and away from the transistor-gate regions. There are many metal-quality and thickness challenges to overcome when developing a repeatable eutectic die-attach process, including avoiding contamination, the quality of the pickup collets, and efficient but accurate screening procedures. This workshop details the key factors in determining if a eutectic die-attach process is sophisticated enough to serve the mission-critical applications of today’s aerospace, military, Satcom, and telecommunications applications.