Abstract:
In anticipation of explosive growth in the IoT device arena, manufacturers are modernizing their test floors to support the diverse needs of these devices. Shorter life cycles, lower volumes, and diverse product mix are driving the evolution of ATE to keep pace with the measurement requirements of this broad class of devices in the industrial, automotive, and commercial markets. This has spurred a reevaluation of established paradigms of test economics and ATE capability in order to address the current and future test requirements. Modular ATE with a configurable test architecture is emerging as
the prescribed solution to tackle the low-cost, variable volume, and eclectic test requirements of IoT. This discussion looks at the elements of IoT test that are shaping these new test mindsets and the subsequent evolution in ATE to support it. Topics of particular interest include the logistics of configuring/re-configuring ATE for variable device requirement, supporting large-scale, tester configuration management on a mixed ATE test floor, and identifying the metrics of modular
ATE that optimize test cost-efficiency, time-to-market, and capability scaling.