Abstract:
With the wide adoption of new technologies, it has become crucial for today’s SOCs to use advanced test and robustness optimization solutions. These solutions provide comprehensive detection, repair and functional safety of not only manufacturing defects, but also failures in field operation. Moreover, with the adoption of FinFET technologies, these advanced solutions are extended to cover new FinFET specific challenges. This keynote, besides discussing the key trends and challenges of new technologies, will cover solutions to handle the wide range of potential test and robustness problems during all periods of the SoC lifecycle: design, post silicon bring-up, volume production, in the filed power on self-test (POST) and in-system operation.