Test Forum will also showcase select presentations from the recent BiTS (Burn-in Test Strategies) and SW (Semiconductor Wafer Test) Test Workshops. The BiTS Workshop is dedicated to providing a forum for the latest information on a broad range of test topics including final, wafer sort, and burn-in. The SW Test Workshop focuses on all the aspects associated with microelectronic wafer and die level testing. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas.
