SEMICON West 2016
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Sessions
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Day
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Test Executive Panel: Economics Perspectives at Test
(
North Hall, Room 131
)
12 Jul 16
10:30 AM
-
12:30 PM
Life at the Bleeding Edge: Changing Test Strategies to Meet Market Requirements- Octavio Martinez, Qualcomm
(
North Hall, Room 131
)
12 Jul 16
10:35 AM
-
10:50 AM
Operational Efficiency Opportunities at Test- Dale Ohmart, TI
(
North Hall, Room 131
)
12 Jul 16
10:50 AM
-
11:05 AM
Test Development Economics and Challenges - Greg Lewis, ASE Group
(
North Hall, Room 131
)
12 Jul 16
11:05 AM
-
11:20 AM
Managing Higher Test Costs- Michel Villemain, Presto Engineering
(
North Hall, Room 131
)
12 Jul 16
11:20 AM
-
11:35 AM
That Probe Card Costs How Much?!- Mike Slessor, FormFactor
(
North Hall, Room 131
)
12 Jul 16
11:35 AM
-
11:50 AM
Test Executive Q&A Panel Discussion
12 Jul 16
11:50 AM
-
12:30 PM
Test Showcase
(
North Hall, Room 131
)
12 Jul 16
2:00 PM
-
4:00 PM
Test Showcase Welcome- BiTS and SW Test Introductions: Ira Feldman, Feldman Engineering & Reynaldo Rincon, NXP
(
North Hall, Room 131
)
12 Jul 16
2:00 PM
-
2:20 PM
Characterize Only the High Speed Interconnect Performance- Carol McCuen, R&D Altanova
(
North Hall, Room 131
)
12 Jul 16
2:20 PM
-
2:40 PM
Prediction of Contact Mark for QFN Package- Yuanjun Shi, Twin Solutions
(
North Hall, Room 131
)
12 Jul 16
2:40 PM
-
3:00 PM
Probing Cu Pillar Applications with Vertical Technologies- Brandon Mair, Texas Instruments
(
North Hall, Room 131
)
12 Jul 16
3:00 PM
-
3:20 PM
Production Test RF Calibration for Multi‐DUT Probe Cards: How to get the Most Accurate Measurements- Daniel Bock, Cascade Microtech
(
North Hall, Room 131
)
12 Jul 16
3:20 PM
-
3:40 PM
Test Showcase Q&A and Closing Remarks
(
North Hall, Room 131
)
12 Jul 16
3:40 PM
-
4:00 PM
Test Vision 2020
(
North Hall, Room 131
)
13 Jul 16
10:30 AM
-
4:20 PM
Test Vision 2020- Welcome Remarks: Amy Leong, FormFactor
(
North Hall, Room 131
)
13 Jul 16
10:30 AM
-
10:35 AM
Test Vision 2020 Program Overview: Stacy Ajouri, Texas Instruments
(
North Hall, Room 131
)
13 Jul 16
10:35 AM
-
10:40 AM
Keynote: Advanced Packaging Trends and the Impact on Test - Jan Vardaman, TechSearch International
(
North Hall, Room 131
)
13 Jul 16
10:40 AM
-
11:35 AM
Session 1: Future of Analog Test
13 Jul 16
11:35 AM
-
12:30 PM
Session 1: New ATE Solutions for Upcoming Analog Test Needs- Derek Floyd, Advantest
(
North Hall, Room 131
)
13 Jul 16
11:40 AM
-
12:05 PM
Session 1: New Realities of Test: From the ATE Perspective - Devin Morris, Roos Instruments
(
North Hall, Room 131
)
13 Jul 16
12:05 PM
-
12:30 PM
Best Paper Award and Presentation - Ben Brown, Xcerra
(
North Hall, Room 131
)
13 Jul 16
2:00 PM
-
2:25 PM
Session 2: Advanced Packaging and Test Challenges
13 Jul 16
2:00 PM
-
3:20 PM
Session 2: Verification of High-Bandwidth Memory (HBM) Through Direct Probing on Microbumps - Marc Loranger, FormFactor
(
North Hall, Room 131
)
13 Jul 16
2:25 PM
-
2:50 PM
Session 2: Thermal Testing of Singulated Devices Gets Us Closer to Known-Good Die/Stack - Dave Armstrong, Advantest
(
North Hall, Room 131
)
13 Jul 16
2:50 PM
-
3:15 PM
Panel: 3D/2.5D/SiP: What Should be Tested, Who Should Do it and Where?
(
North Hall, Room 131
)
13 Jul 16
3:20 PM
-
4:20 PM
Test Vision 2020 Reception and Poster Session
(
North Hall, Room 130
)
13 Jul 16
4:20 PM
-
6:00 PM
Silicon is the New Steel: Building the Internet of Everything -- the World's First Terascale Network -Thomas Lee, Stanford University
(
North Hall, Room 131
)
14 Jul 16
10:30 AM
-
11:15 AM
Session 3: Advanced Test Methods
(
North Hall, Room 131
)
14 Jul 16
11:20 AM
-
12:35 PM
Session 3: What can a Built in CPU do for the Mixed Signal Test Engineer?- Bhavna Guidry, Texas Instruments
(
North Hall, Room 131
)
14 Jul 16
11:20 AM
-
11:45 AM
Session 3: ATE ResourceMerge Method for High Current Capability - Luis Parga, Rafael Hernandez, Texas Instruments
(
North Hall, Room 131
)
14 Jul 16
11:45 AM
-
12:10 PM
Session 3: Design Driven Dynamic Pattern Data - Austin Nobis, AMD
14 Jul 16
12:10 PM
-
12:35 PM
Test & Robustness in Today’s Advanced Technologies - Yervant Zorian, Synopsys
(
North Hall, Room 131
)
14 Jul 16
2:10 PM
-
2:55 PM
Session 4: Shocking the Test Floor
(
North Hall, Room 131
)
14 Jul 16
3:00 PM
-
3:50 PM
Session 4: Operational and Safety Considerations for Ultra-high-Voltage Integration into Semiconductor Testing - Joseph Yehle, Texas Instruments
(
North Hall, Room 131
)
14 Jul 16
3:00 PM
-
3:25 PM
Session 4: Experience of Data Analytics for Yield Optimization - Sebastian Siatkowski , UC, Santa Barbara
(
North Hall, Room 131
)
14 Jul 16
3:25 PM
-
3:50 PM
Test Vision 2020- Closing Remarks – General Chair: Amy Leong, FormFactor
(
North Hall, Room 131
)
14 Jul 16
3:50 PM
-
4:00 PM
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